產品明細

RTO6

示波器

    產品簡述
    ♦ 測試頻寬: 最大6 GHz
    ♦ 每秒最多可顯示1 million waveforms
    ♦ 有效位數ENOB達9.4
    ♦ 最大記憶深度: 2 Gpoints
    ♦ 專屬頻區觸發(Exclusive frequency zone trigger)
      詢價

      產品詳細介紹Product Introduction

      The R&S®RTO6 is the oscilloscope you can trust. Engineered to deliver reliable results, it is a sophisticated laboratory companion to solve measurement problems fast and keep things on schedule. R&S®RTO6 oscilloscopes leverage engineering expertise and improve measurement confidence with deep insights whenever needed.

      R&S®RTO6 oscilloscopes provide superior signals for insight into your applications. The large 15.6" touchscreen and streamlined GUI, combined with high waveform update rate, excellent signal fidelity, digital trigger and deep responsive memory serve as a fully integrated test solution for frequency, protocol and logic analysis. The rich measurement toolset for R&S®RTO6 oscilloscopes and streamlined user interface help quickly solve circuit issues, from simple to complex.

      A high input sensitivity and very low inherent noise mean that R&S®RTO6 oscilloscopes are optimized to perform precise measurements. High-definition (HD) mode enables easy visualization and triggering on signals with up to 16 bit resolution. R&S®RTO6 oscilloscopes detect and display sporadic signal faults with an industry-leading update rate of up to 1 million waveforms/s.

      Today's designs cross multiple measurement domains: time, frequency and protocol. R&S®RTO6 oscilloscopes simplify debugging of systems with different signal types by providing a flexible user interface that allows these domains to be viewed simultaneously. The Rohde&Schwarz digital trigger architecture also enables triggering on complex signal details. This unique trigger system even lets you specify “where” to trigger in the time or frequency domain simply by drawing a special zone directly on the waveform screen.

      R&S®RTO6 oscilloscopes are extremely easy to use. The touchscreen-optimized GUI has gesture operations and the R&S®SmartGrid function for complex screen layouts. Setting up intricate measurement tasks is only a matter of dragging waveforms to where they work best for you. The app cockpit provides a one-tap location to access all of the available oscilloscope applications.

      Features:
      • PROVIDING SUPERIOR MEASUREMENTS - ENABLING TECHNOLOGIES
        • Superior low-noise components
        • Outstanding A/D converter
        • Fastest throughput ASIC
        • FINDING SIGNAL ANOMALIES QUICKLY - WITH UNPARALLELED UPDATE RATES
        • 1 000 000 waveforms/s
        • Available with active histograms, masks or cursor measurements
        • Quickly and reliably detect sporadic signal faults
        • Mask testing: quick configuration and fast results
      • CAPTURING ALL SIGNAL DETAILS - WITH EXCELLENT SIGNAL INTEGRITY
        • Low-noise frontends and minimized crosstalk
        • Flat frequency response
        • Excellent long-term stability
        • Outstanding A/D converter with ultra-wide SFDR
        • SEEING MORE - WITH UP TO 16 bit RESOLUTION
        • 16 bit resolution for measuring small signal amplitudes
        • High acquisition rate and full functionality
        • Full sample rate: no aliasing
        • User-selectable filtering: reduced noise, increased ENOB
      • FINDING COMPLEX SIGNAL DETAILS - WITH ADVANCED TRIGGER CAPABILITIES
        • Unique trigger system
        • High trigger sensitivity at full bandwidth
        • Isolate smallest signal details
        • Zone trigger in time and frequency domain
      • MEASURING MORE - WITH DEEP AND RESPONSIVE MEMORY
        • Maximized memory: 200 Mpoints standard, 2 Gpoints optional
        • Segmented memory to capture distant trigger events
        • History mode to analyze previous trigger events
        • Search and navigation: find faults fast
      • ENHANCED USABILITY
        • 15.6" high-resolution capacitive touchscreen
        • Customizable waveform display
        • Maximized waveform area
        • Intuitive front panel increases user productivity
        • Clear orientation with color-coded LEDs
        • Active probe interface
      • SUPERIOR USER EXPERIENCE - ADVANCED USABILITY, EASY DOCUMENTATION, FAST REMOTE CONTROL
        • Quick access to important tools
        • Advanced setup with compact menu structure
        • Signal bar and preview icons
        • Signal activators and main menu
        • Save results fast
        • Documentation at the press of a button
        • Remote control access: anytime, anywhere
        • Easy selection of instrument setup
        • Language selection

      Applications:
      • TACKLING NOVEL, COMPLEX ISSUES - COMPREHENSIVE TOOLS FOR FAST AND ACCURATE RESULTS
        • Hardware-accelerated measurement functions and math operations
        • Wide range of basic analysis functions
        • Multi-instrument capabilities
        • Industry-leading zone trigger and mask testing
        • Application-specific software options
      • SPECTRUM ANALYSIS - RF knowledge in an oscilloscope
        • Multichannel spectrum analysis (up to eight in parallel)
        • Zone trigger for time and frequency domain
        • Gated FFT for easy frequency and time correlation
        • Spectrogram displays changes in spectrum over time
        • Better and faster insights: logarithmic display and peak list
      • POWER ANALYSIS AND EMI DEBUGGING - Engineered for power and EMI measurements
        • See power signal details with up to 16 bit resolution
        • Maintain fast sampling rates with deep memory
        • Visualize sporadic emissions
        • Specialized measurement functions: fast and accurate results
        • Extensive probe portfolio: high voltage and current probes
      • POWER INTEGRITY - Debugging and validating power rails
        • Accurately measure power ripple and PARD
        • Find coupled sources with fast FFT
        • Power rail characterization with high-fidelity probes
        • Large DC offsets and integrated high precision DC voltmeter
      • SERIAL BUS ANALYSIS - Easy triggering, decoding and protocol analysis
        • Hardware-based triggering and decoding for fast analysis
        • Decoding of up to four serial buses
        • simultaneously
        • Advanced bus measurements for in-depth analysis
        • Search functions for easier analysis of long and complex signals
      • AUTOMATED COMPLIANCE TESTS - Validate your design
        • Easy configuration and automatic control
        • Flexible test execution
        • Straightforward, configurable reports
      • SERIAL INTEGRITY ANALYSIS - Extensive debugging and analysis capabilities
        • Powerful basic jitter analysis
        • Deep system insights with jitter and noise decomposition
        • Clock data recovery for analyzing embedded clock signals in real time
        • Serial pattern trigger
      • WIDEBAND RF AND SIGNAL ANALYSIS - Analyze I/Q data WIDEBAND RF AND SIGNAL ANALYSIS
        • Real-time conversion of modulated signals to I/Q data
        • Precise wideband RF signal analysis
        • Advanced signal analysis
      • LOGIC ANALYSIS - Enhance your mixed-signal analysis capabilities
        • Mixed-signal option for logic analysis
        • Additional 16 digital channels with no reduction of analog channels
        • More signal details thanks to high time resolution over the entire memory depth
        • Precise triggering on signal events
        • Low test point loading from active probing
      • SPECIALIZED SIGNAL ANALYSIS - Measurement options for in-depth measurements
        • Realtime math for differential signals
        • Deembedding for waveform correction
        • Characterization and debugging of signal paths
        • Differential pulse signal with configurable parameters

      Specifications:       
      Vertical system
      Input channels 4 channels
      Input impedance50 Ω ± 2.5%
      50 Ω ± 1.5% (typ.),
      1 MΩ ± 1% || 15 pF (meas.)
      Analog bandwidth (–3 dB) at 50 Ω input impedance
        R&S®RTO6-B90 option ≥ 600 MHz
        R&S®RTO6-B91 option ≥ 1 GHz
        R&S®RTO6-B92 option ≥ 2 GHz
        R&S®RTO6-B93 option ≥ 3 GHz
        R&S®RTO6-B94 option ≥ 4 GHz
        R&S®RTO6-B96 option ≥ 6 GHz on 2 channels,
      ≥ 4 GHz on 4 channels
      at 1 MΩ input impedance ≥ 500 MHz (meas.)
      Bandwidth limit filters brick wall (noise optimized),
      Gaussian (step-response optimized)
      Analog bandwidth limits max. –1.5 dB, min. –4 dB 200 MHz, 20 MHz
      Rise time/fall time 10% to 90% at 50 Ω, bandwidth limit Gaussian, except R&S®RTO6-B94 option brick wall (meas.)
        R&S®RTO6-B90 option 528 ps
        R&S®RTO6-B91 option 319 ps
        R&S®RTO6-B92 option 188 ps
        R&S®RTO6-B93 option 135 ps
        R&S®RTO6-B94 option 104 ps
        R&S®RTO6-B96 option 77 ps
      Input VSWR input frequency R&S®RTO6-B90, R&S®RTO6-B91, R&S®RTO6-B92,
      R&S®RTO6-B93, R&S®RTO6-B94 options
        ≤ 2 GHz 1.25 (meas.)
        > 2 GHz 1.4 (meas.)
      input frequency R&S®RTO6-B96 option
        ≤ 2 GHz 1.25 (meas.)
        > 2 GHz to ≤ 4 GHz 1.6 (meas.)
        > 4 GHz 2.0 (meas.)
      Vertical resolution 16 bit system architecture
      Effective number of bits (ENOB) at 50 Ω, 50 mV/div, 10 MHz input signal with 90% full scale (meas.)
        Bandwidth ENOB
          50 MHz 9.4
          100 MHz 9
          200 MHz 8.6
          300 MHz 8.2
          500 MHz 8.1
          1 GHz 7.7
          2 GHz 7.1
          4 GHz 6
          6 GHz 6.1
      DC gain accuracyoffset and position set to 0 V, after self-alignment
        at 50 Ω, input sensitivity > 5 mV/div ±1.5%
        at 50 Ω, input sensitivity ≤ 5 mV/div ±2%
        at 1 MΩ ±2%
      Input coupling at 50 Ω DC, GND
      at 1 MΩ DC, AC (> 7 Hz), GND
      Input sensitivity at 50 Ω1 mV/div to 1 V/div, entire analog bandwidth
      supported for all input sensitivities
      at 1 MΩ 1 mV/div to 10 V/div, entire analog bandwidth
      supported for all input sensitivities
      Maximum input voltage at 50 Ω 5 V (RMS)
      at 1 MΩ150 V (RMS), 200 V (Vp),
      derates at 20 dB/decade to 5 V (RMS) above 250 kHz
      at 1 MΩ with R&S®RT-ZP10 passive probe400 V (RMS), 1650 V (Vp), 300 V (RMS) CAT II for derating and details see data sheet
      R&S®RT-Zxx Standard Probes, PD 3607.3851.22
      Position range ±5 div
      Offset range at 50 Ω input sensitivity
        > 316 mV/div to ≤ 1 V/div ±10 V
        > 100 mV/div to ≤ 316 mV/div ±3 V
        1 mV/div to ≤ 100 mV/div ±1 V
      Offset range at 1 MΩ input sensitivity
        > 3.16 V/div to ≤ 10 V/div ±(115 V – input sensitivity × 5 div)
        > 1 V/div to ≤ 3.16 V/div ±100 V
        > 316 mV/div to ≤ 1 V/div ±(11.5 V – input sensitivity × 5 div)
        > 100 mV/div to ≤ 316 mV/div ±10 V
        > 31.6 mV/div to ≤ 100 mV/div ±(1.15 V – input sensitivity × 5 div)
        1 mV/div to ≤ 31.6 mV/div ±1 V
      Offset accuracy±(0.35% × |net offset| +
      2.5 mV + 0.1 div × input sensitivity)
      (net offset = offset – position × input sensitivity)
      DC measurement accuracyafter adequate suppression of measurement noise using high-resolution sampling mode, waveform averaging or a combination of both±(DC gain accuracy × |reading – net offset| + offset accuracy)
      Channel-to-channel isolation (each channel at same input sensitivity)input frequency within instrument bandwidt
        ≤ 2 GHz > 60 dB
        > 2 GHz to ≤ 4 GHz > 50 dB
        > 4 GHz to ≤ 6 GHz > 40 dB
      RMS noise floor at 50 Ω (typ.)
      (bandwidth limit brick wall)      		input sensitivity R&S®RTO6-B90 option R&S®RTO6-B91 option
        1 mV/div 0.06 mV 0.09 mV
        2 mV/div 0.07 mV 0.09 mV
        5 mV/div 0.10 mV 0.12 mV
        10 mV/div 0.17 mV 0.20 mV
        20 mV/div 0.32 mV 0.37 mV
        50 mV/div 0.86 mV 0.93 mV
        100 mV/div 1.60 mV 1.79 mV
        200 mV/div 2.87 mV 3.53 mV
        500 mV/div 6.20 mV 8.76 mV
        1 V/div 10.9 mV 17.2 mV
      input sensitivity R&S®RTO6-B92 option R&S®RTO6-B93 option
        1 mV/div 0.13 mV 0.16 mV
        2 mV/div 0.13 mV 0.17 mV
        5 mV/div 0.16 mV 0.20 mV
        10 mV/div 0.26 mV 0.32 mV
        20 mV/div 0.49 mV 0.59 mV
        50 mV/div 1.18 mV 1.43 mV
        100 mV/div 2.37 mV 2.85 mV
        200 mV/div 4.68 mV 5.67 mV
        500 mV/div 12.1 mV 14.4 mV
        1 V/div 24.1 mV 28.8 mV
      input sensitivity R&S®RTO6-B94 option R&S®RTO6-B96 option
        1 mV/div 0.22 mV 0.33 mV
        2 mV/div 0.22 mV 0.33 mV
        5 mV/div 0.26 mV 0.34 mV
        10 mV/div 0.39 mV 0.47 mV
        20 mV/div 0.72 mV 0.80 mV
        50 mV/div 1.75 mV 1.90 mV
        100 mV/div 3.40 mV 3.55 mV
        200 mV/div 6.95 mV 7.20 mV
        500 mV/div 17.9 mV 18.9 mV
        1 V/div 35.6 mV 37.3 mV
      RMS noise floor at 1 MΩ (meas.) input sensitivity
        1 mV/div 0.13 mV
        2 mV/div 0.13 mV
        5 mV/div 0.17 mV
        10 mV/div 0.26 mV
        20 mV/div 0.47 mV
        50 mV/div 1.15 mV
        100 mV/div 2.30 mV
        200 mV/div 4.70 mV
        500 mV/div 11.5 mV
        1 V/div 23.0 mV
        2 V/div 46.0 mV
        5 V/div 115 mV
        10 V/div 230 mV
      RMS noise floor for HD mode at 50 Ω (meas.) bandwidthinput sensitivity
      1 mV/div 10 mV/div 100 mV/div
      10 MHz 10 µV 18 µV 150 µV
      100 MHz 31 µV 56 µV 470 µV
      500 MHz 63 µV 110 µV 960 µV
      1 GHz 92 µV 170 µV 1.41 mV
      2 GHz 140 µV 220 µV 1.78 mV
      Horizontal system
      Timebase range selectable between 25 ps/div and 10 000 s/div,
      time per div settable to any value within range
      Channel deskew ±100 ns
      Reference position 0% to 100% of measurement display area
      Trigger offset range max. +(memory depth/current sampling rate)
      min. –10000 s
      Modes normal, roll
      Channel-to-channel skew < 100 ps (meas.)
      Timebase accuracy after delivery/calibration, at +23°C ±10 ppb
      during calibration interval ±100 ppb
      long-term stability (more than one year since calibration) ±(50 + 50 × years since calibration) ppb
      Delta time accuracycorresponds to time error between two edges on same acquisition and channel;
      signal amplitude greater than 5 divisions,
      measurement threshold set to 50%,
      vertical gain 10 mV/div or greater;
      rise time lower than four sample periods;
      waveform acquired in realtime mode      		±(K/realtime sampling rate +
      timebase accuracy × |reading|) (peak) (meas.) where
      K = 0.15 (R&S®RTO6-B90 option)
      K = 0.18 (R&S®RTO6-B91 option)
      K = 0.25 (R&S®RTO6-B92 option)
      K = 0.37 (R&S®RTO6-B93 option)
      K = 0.43 (R&S®RTO6-B94 option)
      K = 0.55 (R&S®RTO6-B96 option)

      Acquisition system
      Realtime sampling rateR&S®RTO6-B90, R&S®RTO6-B91,
      R&S®RTO6-B92, R&S®RTO6-B93 options       		max. 10 Gsample/s on each channel
      R&S®RTO6-B94, R&S®RTO6-B96 options max. 10 Gsample/s on 4 channels, max. 20 Gsample/s on 2 channels
      Realtime waveform acquisition ratemax.> 1000000 waveforms/s
      Memory depth1)standard200 Mpoints on 4 channels, 400 Mpoints on 2 channels, 800 Mpoints on 1 channel
      R&S®RTO6-B104 option400 Mpoints on 4 channels, 800 Mpoints on 2 channels (restriction: 400 Mpoints on 2 channels when channel 1 and 2 or channel 3 and 4 are turned on), 800 Mpoints on 1 channel
      R&S®RTO6-B110 option1 Gpoints on 4 channels, 2 Gpoints on 2 channels (restriction: 1 Gpoints on 2 channels when channel 1 and 2 or channel 3 and 4 are turned on), 2 Gpoints on 1 channel
      Realtime digital filters selectable for the data acquisition and/or the trigger system
        lowpasscutoff frequency selectable from 100 kHz to ana[1]log bandwidth
      Decimation modessamplefirst sample in decimation interval
      peak detectlargest and smallest sample in decimation interval
      high resolution average value of samples in decimation interval
      root mean square root of squared average of samples in decima[1]tion interval
      Waveform arithmeticoffno arithmetic
      envelopeenvelope of acquired waveforms
      averageaverage of acquired waveforms, max. average depth depends on decimation mode 2)
        samplemax. 16777215
        high resolution max. 65535
        root mean squaremax. 255
      reset conditionno reset (standard), reset by time, reset by num[1]ber of processed waveforms
      Waveform streams per channelup to 3 with independent selection of decimation mode and waveform arithmetic
      Sampling modesrealtime mode max. sampling rate set by digitizer
      interpolated timeenhancement of sampling resolution by interpolation;
      max. equivalent sampling rate is 4 Tsample/s
      Interpolation modeslinear, sin(x)/x, sample&hold
      Ultra segmented modecontinuous recording of waveforms in acquisition memory without interruption due to visualization
        max. realtime waveform acquisition rate> 2500000 waveforms/s
         min. blind time between consecutive acquisitions< 300 ns
      1) The maximum available memory depth depends on the bit depth of the acquired data and, therefore, on the settings of the acquisition system, such as decimation mode, waveform arithmetic, number of waveform streams or high definition mode.
      2) Waveform averaging is not compatible with peak detect decimation.

      Differential signals
      General descriptionCalculation of differential and common mode signals from p part and n part connected to separate input channels. The R&S®RTO64 digital trigger concept enables these signals to be used as a trigger input.
      Input channelschannel 1, channel 2, channel 3, channel 4
      Differential signal difference between two input channels channel 1 and channel 2, channel 3 and channel 4
      Common mode signalsum of two input channels channel 1 and channel 2, channel 3 and channel 4
      Maximum number of outputsdifferential signals2
      common mode signals2
      High definition mode
      General descriptionThe high definition mode increases the numeric resolution of waveform signals with digital filtering to reduce noise. The signals with increased numeric resolution are used as a triggering input thanks to the R&S®RTO64 digital trigger concept.
      Numeric resolutionR&S®RTO6-B90, R&S®RTO6-B91, R&S®RTO6-B92, R&S®RTO6-B93, R&S®RTO6-B94, R&S®RTO6-B96 options (4 channels)
      bandwidth bit resolution
      10 kHz to 50 MHz 16 bit
      100 MHz 14 bit
      200 MHz 13 bit
      300 MHz 12 bit
      500 MHz 12 bit
      1 GHz 10 bit
      R&S®RTO6-B94, R&S®RTO6-B96 options (2 channels)
      bandwidth bit resolution
      10 kHz to 200 MHz 16 bit
      300 MHz 12 bit
      500 MHz 12 bit
      1 GHz 11 bit
      2 GHz 10 bit
      Realtime sampling rateR&S®RTO6-B90, R&S®RTO6-B91,
      R&S®RTO6-B92, R&S®RTO6-B93,
      R&S®RTO6-B94, R&S®RTO6-B96 options (4 channels)      		max. 5 Gsample/s on each channel
      R&S®RTO6-B94, R&S®RTO6-B96 options (2 channels)max. 10 Gsample/s on each channel
      Input sensitivityinput sensitivity range extends down to 500 µV/div;
      500 µV/div is a magnification of 1 mV/div setting.
      Trigger system
      Sources channel 1, channel 2, channel 3, channel 4, inverted channels, external trigger, differential, common mode
      Sensitivity 10–4 div, from DC to instrument bandwidth for all vertical scales
      Trigger jitter full-scale sine wave of frequency set to –3 dB bandwidth < 1 ps (RMS) (meas.)
      Coupling mode standard same as selected channel
      lowpass filter cutoff frequency selectable from 100 kHz to 50% of analog bandwidth
      Sweep mode auto, normal, single, n single
      Event rate max. one event for every 400 ps time interval
      Trigger level range ±5 div from center of screen
      Trigger hysteresis modes auto (standard) or manual
      sensitivity 10–4 div, from DC to instrument bandwidth for all vertical scales
      Holdoff range time 100 ns to 10 s, fixed and random
      events 1 event to 2000000000 events
      Main trigger modes
      Edgetriggers on specified slope (positive, negative or either) and level
      Glitchtriggers on glitches of positive, negative or either polarity that are shorter or longer than specified width
        glitch width 100 ps to 1000 s
      50 ps to 1000 s
      (R&S®RTO6-B94, R&S®RTO6-B96 options)
      Widthtriggers on positive or negative pulse of specified width; width can be shorter, longer, inside or outside the interval
        pulse width 100 ps to 1000 s
      50 ps to 1000 s
      (R&S®RTO6-B94, R&S®RTO6-B96 options)
      Runttriggers on pulse of positive, negative or either polarity that crosses one threshold but fails to cross a second threshold before recrossing the first one; runt pulse width can be arbitrary, shorter, longer, inside or outside the interval
        runt pulse width 100 ps to 1000 s
      50 ps to 1000 s
      (R&S®RTO6-B94, R&S®RTO6-B96 options)
      Windowtriggers when signal enters or exits a specified voltage range; triggers also when signal stays inside or outside the voltage range for a specified period of time
      Timeouttriggers when signal stays high, low or unchanged for a specified period of time
        timeout 100 ps to 1000 s
      50 ps to 1000 s
      (R&S®RTO6-B94, R&S®RTO6-B96 options)
      Intervaltriggers when time between two consecutive edges of same slope (positive or negative) is shorter, longer, inside or outside a specified range
        interval time 100 ps to 1000 s
      50 ps to 1000 s
      (R&S®RTO6-B94, R&S®RTO6-B96 options)
      Slew ratetriggers when the time required by a signal edge to toggle between user-defined upper and lower voltage levels is shorter, longer, inside or outside the interval; edge slope may be positive, negative or either
        toggle time 100 ps to 1000 s
      50 ps to 1000 s
      (R&S®RTO6-B94, R&S®RTO6-B96 options)
      Data2clocktriggers on setup time and hold time violations between clock and data present on any two input channels; users can specify monitored time interval ranging from –100 ns to 100 ns around a clock edge and must be at least 100 ps wide
      Patterntriggers when a logical combination (and, nand, or, nor) of the input channels stays true for a period of time shorter, longer, inside or outside a specified range
      State triggers when a logical combination (and, nand, or, nor) of the input channels stays true at a slope (positive, negative or either) in one selected channel
      Serial pattern triggers on serial data pattern up to 128 bit clocked by one input channel; pattern bits may be high (H), low (L) or don’t care (X); clock edge slope may be positive, negative or either; hardware CDR selectable as clock source (requires R&S®RTO6-K13 option)
      max. data rate < 2.50 Gbps
      < 5 Gbps
      (R&S®RTO6-B94, R&S®RTO6-B96 options)
      TV/videotriggers on baseband analog progressive and interlaced video signals including NTSC, PAL, PAL-M, SECAM, EDTV and HDTV broadcast standards as well as custom bi-level and tri-level sync video standards
        trigger modes all fields, odd fields, even fields, all lines, line number
      Advanced trigger modes
      Zone trigger triggers on user-defined zones drawn on the display
        source acquired waveforms (input channels), math waveforms
        number of zones up to 8
        zone shapes rectangles, polygones
        zone typesmust intersect, must not intersect
        combination of zones logical combination of zones of multiple sources using Boolean expressions
        trigger compatibility compatible with the edge, glitch, width, runt, window, timeout, interval, slew rate, data2clock, pattern, state, serial pattern, trigger qualification, and sequence trigger modes
      Trigger qualificationtrigger events may be qualified by a logical combination of unused channels
        qualifiable events edge, glitch, width, runt, window, timeout, interval
      Sequence trigger (A/B/R trigger)triggers on B event after occurrence of A event; delay condition after A event specified either as time interval or number of B events; an optional R event resets the trigger sequence to A
        A event any trigger mode
        B event edge, glitch, width, runt, window, timeout, interval, slew rate
        R event edge, glitch, width, runt, window, timeout, interval, slew rat
      Serial bus trigger optional see dedicated triggering and decoding options
      NFC trigger with R&S®RTO6-K11 option
      CDR triggertriggers on clock signal recovered from the trigger source signal; phase of the trigger instant userselectable as fraction of bit period; requires R&S®RTO6-K13 option
      CDR configuration parameters PLL order (first or second), nominal bit rate, loop bandwidth, relative bandwidth, damping factor, unit interval offset
      CDR bit rate range
        R&S®RTO6-B92,
        R&S®RTO6-B93 options       		200 kbps to 2.5 Gbps
        R&S®RTO6-B94, R&S®RTO6-B96 options200 kbps to 2.5 Gpbs standard,
      400 kbps to 5.0 Gbps when operating at
      20 Gsample/s realtime sampling rate       3)
      External trigger input input impedance 50 Ω (nom.) or 1 MΩ (nom.) || 20 pF (meas.)
      max. input voltage at 50 Ω 5.5 V (peak)
      max. input voltage at 1 MΩ 30 V (RMS)
      derates at 20 dB/decade to 5 V (RMS) above 25 MHz
      trigger level ±5 V
      sensitivity
        input frequency ≤ 100 MHz 300 mV (Vpp)
        100 MHz < input frequency ≤ 500 MHz 600 mV (Vpp)
      input coupling AC, DC (50 Ω and 1 MΩ), GND, HF reject (attenuates > 50 kHz or > 50 MHz, user-selectable),
      LF reject (attenuates < 5 kHz or < 50 kHz, user-selectable)
      trigger modes edge (rise or fall)
      Trigger out functionality a pulse is generated for every acquisition trigger even
      output voltage 0 V to 5 V at high impedance; 0 V to 2.5 V at 50 Ω
      pulse width selectable between 50 ns and 60 ms
      pulse polarity low active or high active
      output delay depends on trigger settings
      jitter ±600 ps (meas.)
      3) The frontends of the R&S®RTO6-B94 and the R&S®RTO6-B96 sample at 20 Gsample/s when at most one channel of each pair {channel 1, channel 2} and {channel 3, channel 4} is active; and the user-selected sampling resolution in realtime sampling mode or interpolated time sampling mode is 50 ps or smaller.

      RF characteristics 4)
      Sensitivity/noise densityat 1.001 GHz
      (measurement of the power spectral density at 1.001 GHz at input sensitivity 1 mV/div, corresponding to –36 dBm input range of the oscilloscope, using the FFT with center frequency 1.001 GHz, span 500 kHz, RBW 3 kHz)      		–159 dBm (1 Hz) (meas.)
      at 100 kHz
      (measurement of the power spectral density at 100 kHz at input sensitivity 1 mV/div, corresponding to –36 dBm input range of the oscilloscope, using the FFT with center frequency 100 kHz, span 20 kHz, RBW 200 Hz)      		–156 dBm (1 Hz) (meas.)
      Noise figure at 1.001 GHz
      (calculated based on the noise density above)      		 15 dB (meas.)
      at 100 kHz
      (calculated based on the noise density above)      		 18 dB (meas.)
      Signal-to-noise ratiomeasured for an input carrier with frequency 1 GHz and level 0 dBm at input sensitivity 70 mV/div, corresponding to 0 dBm input range of the oscilloscope, using the FFT with center frequency 1 GHz, span 100 MHz, RBW 400 Hz at +20 MHz from the center frequency112 dB (meas.)
      Absolute amplitude accuracy 0 Hz to 5 GHz ±1 dB (meas.)
      Spurious-free dynamic rangemeasured for an input carrier with frequency 950 MHz and level 0 dBm at input sensitivity 70 mV/div, corresponding to 0 dBm input range of the oscilloscope, using the FFT with center frequency 2 GHz, span 4 GHz, RBW 100 kHz 68 dBc (meas.)
      Second harmonic distortionmeasured for an input carrier with frequency 950 MHz and level 0 dBm at input sensitivity 70 mV/div, corresponding to 0 dBm input range of the oscilloscope, using the FFT with center frequency 950 MHz, span 4 GHz, RBW 100 kHz –49 dBc (meas.)
      Third harmonic distortionmeasured for an input carrier with frequency 950 MHz and level 0 dBm at input sensitivity 70 mV/div, corresponding to 0 dBm input range of the oscilloscope, using the FFT with center frequency 950 MHz, span 4 GHz, RBW 100 kHz –44 dBc (meas.)
      4) The RF characteristics are measured for the R&S®RTO6-B96 option with 6 GHz bandwidth.
       
      Waveform measurements
      General featuresmeasurement panelsup to 8 measurement panels;
      each panel may contain any number of automatic measurements of the same catego
      gate delimits the display region evaluated for automatic measurements
      reference levels user-configurable vertical levels define support structures for automatic measurements
      statistics displays maximum, minimum, mean, standard deviation, RMS and measurement count for each automatic measurement
      track measurement results displayed as continuous trace that is time-correlated to the measurement source
      long-term analysis history of selected measurements as trace against count index
      histogram available for the main measurement of each measurement panel; automatic or manual selection of bin number and scale; counters for measurements under, within and over the histogram range
      limit check measurements tested against user-defined margins and limits; pass or fail conditions may launch automatic response: acquisition stop, beep, print and save waveform
      Measurement categoryamplitude and timeamplitude, high, low, maximum, minimum, peak-to-peak, mean, RMS, sigma, overshoot, area, rise time, fall time, positive width, negative width, period, frequency, duty cycle, delay, phase, burst width, pulse count, positive switching, negative switching, cycle area, cycle mean, cycle RMS, cycle sigma, setup/hold time, setup/ hold ratio, pulse train, slew rate rising, slew rate falling, DC voltmeter (requires Rohde&Schwarz active probe with R&S®ProbeMeter function)
      eye diagramextinction ratio, eye height, eye width, eye top, eye base, Q factor, S/N ratio, duty cycle distortion, eye rise time, eye fall time, eye bit rate, eye amplitude, jitter (peak-to-peak, 6-sigma, RMS)
      spectrumchannel power, bandwidth, occupied bandwidth, harmonic search, total harmonic distortion THD in dB and % using power values, total harmonic distortion variants THDa' , THDu and THDr using voltage, overall voltage and overall voltage root means square, peak list (THDa', THDu, THDr and peak list require R&S®RTO6-K37 option)
      jittercycle-to-cycle jitter, N-cycle jitter, cycle-to-cycle width, cycle-to-cycle duty cycle, time-interval error, data rate, unit interval, skew delay, skew phase; requires R&S®RTO6-K12 option
      Cursors setup up to 4 cursor sets on screen, each set consisting of two horizontal and two vertical cursors
      target acquired waveforms (input channels), math waveforms, reference waveforms, track waveforms, XY diagrams
      operating mode vertical measurements, horizontal measurements or both; vertical cursors either set manually or locked to waveform
      Histogram source acquired waveform (input channels), math waveform, reference waveform
      mode vertical (for timing statistics), horizontal (for amplitude statistics)
      automatic measurements waveform count, waveform samples, histogram samples, histogram peak, peak value, maximum, minimum, median, range, mean, sigma, mean ± 1, 2 and 3 sigma, marker ± probability
      Mask testing
      Test definition number of masks up to 8 simultaneously
      source acquired waveforms (input channels), math waveforms
      fail condition sample hit or waveform hit
      fail tolerance minimum number of fail events for test fail in range from 0 to 4000000000
      test rate up to 600000 waveforms/s
      action on error acquisition stop, beep, print and save waveform
      save/load to file test and mask settings (.xml format)
      Mask definition with segments number of independent segments up to 8
      segment definition array of points and connecting rule (upper, lower, inner) define segment region
      segment input point and click on touchscreen, editable list
      Mask definition with tolerance tube input signal acquired waveform
      definition of tolerance tubehorizontal width, vertical width, vertical stretch, vertical position
      Mask definition with eye mask assistant
      (requires R&S®RTO6-K12 option)      		primary mask shape
        type diamond, square, hexagon, octagon
        dimensions main and secondary height, main and secondary width, depending on selected shape
        position vertical offset, horizontal offset
      secondary mask shapes
        locations any combination of left, right, top, bottom
        position horizontal and vertical offset with respect to center of primary mask shape
      Result statistics category completed acquisitions, remaining acquisitions, state, sample hits, mask hits, fail rate, test result (pass or fail)
      Visualization options waveform style vectors, dots
      violation highlightinghits (on/off), highlight persistence (50 ms to 50 s or infinite), waveform color (default: red)
      mask colorsconfigurable colors for mask without violation (default: translucent gray), mask with violation (default: translucent red), mask with contact (default: translucent pale red)
      Waveform math
      General features number of math waveforms up to 8
      number of reference waveforms up to 4
      waveform arithmetic user-selectable average or envelope of consecutive waveforms
      Algebraic expressionsuser may define complex mathematical expressions involving waveforms and measurement results
        math functions add, subtract, multiply, divide, absolute value, square, square root, integrate, differentiate, exp, log10, loge , log2 , rescale, sin, cos, tan, arcsin, arccos, arctan, sinh, cosh, tanh, autocorrelation, crosscorrelation
        logical operatorsc not, and, nand, or, nor, xor, nxor
        relational operators Boolean result of =, ≠, >, <, ≤, ≥
        frequency domain spectral magnitude and phase, real and imaginary spectra, group delay
        digital filter lowpass, highpass
        special functions CDR transform; requires R&S®RTO6-K12 option
      Optimized math operators add, subtract, multiply, invert, absolute value, differentiate, log10, loge , log2 , rescale, FIR, FFT magnitude
      Spectrum analysis FFT magnitude spectrum
        setup parameterscenter frequency, frequency span, frame overlap, frame window (rectangular, Hamming, Hann, Blackman, Gaussian, Flattop, Kaiser Bessel), user-selectable spectrum averaging, RMS, envelope, max. hold and min. hold (max. hold and min. hold require R&S®RTO6-K37 option)
        max. realtime waveform acquisition rate > 1000 waveforms/s
      Search and mark function
      General descriptionscans acquired waveforms for occurrence of a user-defined set of events and highlights each occurrence
      Basic setup source all physical input channels, math waveforms, reference waveforms
      search panels up to 8, where each panel may manage multiple event searches
      search mode manually triggered or continuous
      search conditions
        supported events edge, glitch, width, runt, window, timeout, interval, slew rate, data2clock, state
        event configuration identical to corresponding trigger event
      event selection single or multiple events on same source
      Search oscilloscope mode current waveform, gated time interval
      Result visualization table
        sort mode horizontal position or vertical value
        max. result count specifies max. table size
      zoom window centered on highlighted event
      Display characteristics
      Diagram types Yt, XY, spectrum, long-term measurement, spectrogram (spectrogram requires R&S®RTO6-K37 option)
      Display interface configuration display area can be split up into separate diagram areas by dragging and dropping signal icons; each diagram area can hold any number of signals; diagram areas may be stacked on top of each other and later accessed via the dynamic tab menu
      Signal icon each active waveform is represented by a separate signal icon on the signal bar; the signal icon displays individual vertical and acquisition settings; a waveform can be minimized to signal icon to appears as a realtime preview in miniature; measurement results may also be minimized to a signal icon
      Toolbar quick access to 28 important tools; directly set most common parameters in a simple menu and access to more detailed parameters in main menu; user-defined selection of tools in toolbar
      Upper menu displays trigger, horizontal and acquisition settings; quick access to settings
      Main menu provides access to all instruments settings in compact menu
      Axis label X-axis ticks and Y-axis ticks labeled with tick value and physical unit
      Diagram label diagrams may be individually labeled with a descriptive user-defined name
      Diagram layout grid, crosshair, axis labels and diagram label may be switched on and off separately
      Persistence 50 ms to 50 s, or infinite
      Zoom user-defined zoom window provides vertical and horizontal zoom;
      each diagram area supports multiple zoom windows;
      touchscreen interface simplifies resize and drag operations on zoom window
      Signal colors predefined or user-defined color tables for persistence display
      Input and output
      Front
      Channel inputs BNC-compatible, for details see vertical system
      probe interface auto-detection of passive probes, Rohde&Schwarz active probe interface
      Auxiliary output SMA connector, for future use
      Probe compensation output signal shape rectangle, Vlow = 0 V, Vhigh = 1 V amplitude 1 V (Vpp) ± 5%
      frequency 1 kHz ± 1%
      impedance nom. 50 Ω
      Ground jack connected to ground
      USB interface 2 ports, type A plug, version 2.0
      Rear
      External trigger input BNC, for details see trigger system
      Trigger out BNC, for details see trigger system
      USB interface 2 ports, type A plug and
      1 port, type B plug, version 3.1 Gen 1
      LAN interface RJ-45 connector, supports 10/100/1000BASE-T
      External monitor interface HDMI 2.0 and DisplayPort++ 1.3, output of oscilloscope display or extended desktop display
      GPIB interface see R&S®RTO6-B10 option
      Reference input connector BNC female
      impedance 50 Ω (nom.)
      input frequency range 1 MHz to 20 MHz, in 1 MHz steps
      sensitivity ≥ 0 dBm into 50 Ω, ≥ 8 dBm at 1 MHz
      Reference output connector BNC female
      impedance 50 Ω (nom.)
      output signal with internal reference 10 MHz (specified in timebase accuracy), 7 dBm (nom.)
      output signal with external reference none
      Security slot for standard Kensington style lock
      General data
      Display type 15.6" LC TFT color display with capacitive touchscreen
      resolution 1920 × 1080 pixel (full HD)
      Operating system Windows 10 64 bit
      Temperature
      Temperature loading operating temperature range 0°C to +45°C
      storage temperature range –40°C to +70°C
      Temperature loading in line with MIL-PRF-28800F section 4.5.5.1.1.1 class 3 tailored to +45°C for operation
      Climatic loading+25°C/+40°C at 85% relative humidity cyclic, in line with IEC60068-2-30
      +30°C/+40°C/+45°C at 95/75/45%, in line with MIL-PRF-28800F section 4.5.5.1.1.2 class 3 tailored to +45°C for operation
      Altitude
      Operating up to 3000 m above sea level
      Nonoperating up to 4600 m above sea level
      Mechanical resistance
      Vibration sinusoidal 5 Hz to 150 Hz, max. 1.8 g at 55 Hz; 0.5 g from 55 Hz to 150 Hz, in line with EN60068-2-6
      5 Hz to 55 Hz, in line with MIL-PRF-28800F section 4.5.5.3.2 class 3
      random 10 Hz to 300 Hz, acceleration 1.2 g (RMS), in line with EN60068-2-64
      5 Hz to 500 Hz, acceleration 2.058 g (RMS), in line with MIL-PRF-28800F section 4.5.5.3.1 class 3
      Shock 40 g shock spectrum, in line with MIL-STD-810G, method no. 516.6, procedure I
      30 g functional shock, halfsine, duration 11 ms, in line with MIL-PRF-28800F section 4.5.5.4.1
      EMC
      RF emission in line with CISPR 11/EN55011 group 1 class A (for a shielded test setup); instrument complies with EN55011, EN61326-1 and EN61326-2-1 class A emission requirements and is suitable for use in industrial environments
      Immunity in line with IEC/EN61326-1 table 2, immunity test requirements for industrial environment 5)
      Certifications VDE, CCSAUS, KC
      Calibration interval 1 year
      Power supply
      AC supply 100 V to 240 V at 50 Hz to 60 Hz and 400 Hz, max. 5.5 A to 2.3 A, in line with MIL-PRF 28800F section 3.5
      Power consumption max. 450 W
      Safety in line with IEC61010-1, EN61010-1, CAN/CSA-C22.2 No. 61010-1, UL 61010-1
      Mechanical data
      Dimensions W × H × D 450 mm × 315 mm × 204 mm
      (17.72 in × 12.40 in × 8.03 in)
      Weight without options, nominal 10.7 kg
      (23.59 lb)
      5) Test criterion is displayed noise level within ±1 div for input sensitivity of 5 mV/div.
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